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Digital Circuit Testing and testablity
Material type:
TextPublication details: USA Acadamic Press 1997Description: xii, 199ISBN: - 9780124343306
- 7104 1/1 621.39 LAL-D
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
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KLH Deemed to be University ECE | ECE | 7104 1/1 621.39 LAL-D (Browse shelf(Opens below)) | Available | 7104 |
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| 7076 1/1 006.3 EIS-I Introduction to Natural Laguage Processing | 7100 1/1 681.2 KAR-P Protocols and Architectures for Wirelss Sensor Networks | 7101 1/2 681.2 KAR-P Protocols and Architectures for Wirelss Sensor Networks | 7104 1/1 621.39 LAL-D Digital Circuit Testing and testablity | 7105 1/1 621.381 HOL-D Digital Logic Design | 7106 1/1 006.22 VAL-R Real-Time Operating Sytstems for ARM Contex-m Microcontrollers | 7107 1/1 006.454 RAB-F Fundamentals of Speech Recognition |
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